SDS6000L-EJ Eye Diagram/Jitter Analysis Software

• Eye diagram/jitter analysis for SDS6000L series
• Source: CH1 – CH8
• Eye diagram measure: Eye height, "1" level, "0" level, Eye amplitude, Eye width, Eye crossing, Average power, Q factor, TIE
• Mask Test: Supported
• Jitter analysis Clock recovery: Constant frequency, PLL

SDS6000L-EJ for the SDS6000L series supports eye diagram and jitter analysis / measurement. It can automatically extract the embedded reference clock from serial data and create an eye diagram. Measurement on multiple eye / jitter parameters is provided and mask testing of eye diagrams is supported.